发明名称 Conductive pad design modification for better wafer-pad contact
摘要 An apparatus and method for manufacturing and refurbishing a conductive polishing pad assembly for performing an electrochemical process on a substrate is disclosed. The conductive polishing pad assembly is formed using a contact surface as a foundation that is coated with a metallic coating to create a conductive contact surface. In one embodiment, the metallic coating is a high purity tin/zinc alloy that is sprayed on the contact surface. The contact surface contains abrasive particles while the metallic coating provides at least conductive qualities to the contact surface.
申请公布号 US2006073768(A1) 申请公布日期 2006.04.06
申请号 US20050243488 申请日期 2005.10.04
申请人 APPLIED MATERIALS, INC. 发明人 MAVLIEV RASHID A.;KARUPPIAH LAKSHMANAN
分类号 B24B37/04;B24B37/22;B24B37/24 主分类号 B24B37/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利