发明名称 FLICKER MEASURING METHOD AND FLICKER MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a flicker measuring method with which a flicker measuring cost is kept low and flicker in all dots of an imaging area on a screen, is measured at once. SOLUTION: Projection light from a projector 1 is received by a light sensor 3 attached to a screen 2. A light signal L from the light sensor 3 is filtered by a bandpass filter 4 and a periodic wave F<SB>lc</SB>of liquid crystal flicker caused by an alternate voltage for driving a liquid crystal panel 12, is inputted to an imaging time detecting circuit 5. The imaging time detecting circuit 5 analyses F<SB>lc</SB>and detects two imaging time of a day, t1 and t2 and a video camera 6 images the screen 2. An image processing section 7 calculates the liquid crystal flicker in all dots at once in the imaging area on the screen 2 by performing differential processing of two imaged images. As one light sensor 3 is enough, the number of components is reduced and consequently the measuring cost is reduced. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006091149(A) 申请公布日期 2006.04.06
申请号 JP20040273883 申请日期 2004.09.21
申请人 SEIKO EPSON CORP 发明人 YAMAGISHI HIDEKAZU
分类号 G09G3/36;G01J1/44;G01M11/00;G02F1/13;G09G3/20;G09G5/00;H04N17/04 主分类号 G09G3/36
代理机构 代理人
主权项
地址