发明名称 |
Ion implanter and method of preventing undesirable ions from implanting a target wafer |
摘要 |
An ion implanter is provided having an ion source; an AMU analyzing magnet having a fixed radius R<SUB>am</SUB>; an ion extraction voltage source; a communication interface for monitoring implantation parameters; and an equipment server having a data log. The ion implanter further has an arithmetic processor capable of determining a real-time estimated radius R<SUB>e </SUB>of a circular path of ions being implanted into a target wafer. A method of using the ion implanter provide an interlock on an AMU of each of a plurality of ions being implanted into the target wafer. The method has the step of determining in real-time if an ion implanter is implanting a desired ion into a target wafer. Also, the method determines if an absolute value of an offset between the R<SUB>am </SUB>and R<SUB>e </SUB>exceeds a predetermined radius tolerance level L and adjusts the implanter accordingly if L is exceeded.
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申请公布号 |
US7023003(B2) |
申请公布日期 |
2006.04.04 |
申请号 |
US20040804890 |
申请日期 |
2004.03.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LI CHEN-CHUNG;WENG JUI-CHUN;WANG CHI-CHIEH;KAO TAI-KUN |
分类号 |
H01J37/00;H01J37/08;H01J37/20;H01J37/302;H01J37/304;H01J37/317 |
主分类号 |
H01J37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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