发明名称 Method of producing multilayer interconnection structure
摘要 A method of producing a buried-type multilayer interconnection structure is provided. The method comprises steps of: forming a hole portion in an insulating layer; forming a catalyst layer having average film thickness from 0.2 nm to 10 nm on a surface of the hole portion by a physical vapor deposition method; forming an electroless plating layer on the surface of the hole portion by an electroless plating method using the catalyst layer as a catalyst; and burying up the hole portion with an electrolytic plating layer by an electrolytic plating method using the electroless plating layer as a seed layer.
申请公布号 US7022598(B2) 申请公布日期 2006.04.04
申请号 US20040870942 申请日期 2004.06.21
申请人 SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER 发明人 SHINGUBARA SHOSO;TAKAHAGI TAKAYUKI;WANG ZENGLIN
分类号 C23C18/18;H01L21/4763;C23C14/14;C23C18/31;C25D7/06;H01L21/288;H01L21/768 主分类号 C23C18/18
代理机构 代理人
主权项
地址