发明名称 Semiconductor device loading apparatus for test handlers
摘要 Disclosed herein is a semiconductor device loading apparatus for test handlers. The semiconductor device loading apparatus includes a body. The apparatus body includes a plurality of pickup cylinders provided with a plurality of vacuum adsorbers for vacuum-sucking and transferring semiconductor devices to be tested, a space adjusting plate for adjusting the pitches of the vacuum adsorbers, and an elevation guiding means for guiding the lifting and lowering of the space adjusting plate. A guide block fixing plate is formed to be separate from the body for guiding the semiconductor devices to be accurately positioned in the pockets of a test tray, respectively.
申请公布号 US7023197(B2) 申请公布日期 2006.04.04
申请号 US20010977199 申请日期 2001.10.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG BYUNG-GI
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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