发明名称 CHARGE CAPTURE SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charge capture semiconductor memory device whose size is further reduced. SOLUTION: A memory cell is preferably formed by a cylindrical recess (2), in a main surface of a semiconductor substrate (1) and is provided with a memory layer sequence (3) and a gate electrode (4) in a sidewall. An upper source/drain region (5) and a lower source/drain region (6) which are connected in a queue to a first bit line (8), and a second bit line (9) are provided. A word line (10) is arranged on the upper part of the first bit line (8), and the second bit line (9) and is connected to a row of the gate electrode (4). A transistor structure in the vertical direction facilitates further miniaturization of cells and enables making desired minimum effective channel length. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006086522(A) 申请公布日期 2006.03.30
申请号 JP20050257159 申请日期 2005.09.05
申请人 INFINEON TECHNOLOGIES AG 发明人 VERHOEVEN MARTIN
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址