发明名称 SYSTEM AND METHOD FOR TESTING INTEGRATED CIRCUITS
摘要 A module (236, 236') containing an integrated testing system (108) that includes one or more measurement engines (200, 202) tightly coupled with a compute engine (208). The one or more measurement engines include at least one stimulus instrument (212) for exciting circuitry of a device-under-test (104) with one or more stimulus signals, and at least one measurement instrument (216) that measures the response of the device-under-test to the stimulus signal(s) and generates measurement data. The compute engine includes computation logic circuitry (800) for determining whether or not the circuitry aboard the device-under-test passes or fails. The integrated testing system further includes a communications engine (204) providing two-way communications between the integrated testing system automated testing equipment (116) and/or a dedicated user interface (140) residing on a host computer (136).
申请公布号 WO2005109017(A3) 申请公布日期 2006.03.30
申请号 WO2005US15053 申请日期 2005.05.02
申请人 DFT MICROSYSTEMS, INC.;ROBERTS, GORDON, W.;CHAN, ANTONIO, H.;DUERDEN, GEOFFREY, D.;HAFED, MOHAMED, M.;LABERGE, SEBASTIEN;PISHDAD, BARDIA;TAM, CLARENCE, K., L. 发明人 ROBERTS, GORDON, W.;CHAN, ANTONIO, H.;DUERDEN, GEOFFREY, D.;HAFED, MOHAMED, M.;LABERGE, SEBASTIEN;PISHDAD, BARDIA;TAM, CLARENCE, K., L.
分类号 G01R31/26;G01R31/319 主分类号 G01R31/26
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