发明名称 High resolution photoresist process especially for the production of semiconductors using radiant heating of the resist layer
摘要 <p>A high resolution photoresist process, especially for the production of semiconductors with structures smaller than 50 nm uses radiant heating applied to the upper surface of the resist rather than thermal contact. This applies the heat direct to the resist without thermal lag through the substrate. The heating is applied to dry the resist and/or as a post exposure bake. Suitable thermal sources include IR lasers. The heating is applied for 5 to 180 seconds to generate a temperature of between 120 and 140 deg. C in the resist, with the substrate moved under the heating area at a set speed.</p>
申请公布号 DE102004042300(A1) 申请公布日期 2006.03.30
申请号 DE20041042300 申请日期 2004.08.27
申请人 INFINEON TECHNOLOGIES AG 发明人 ELIAN, KLAUS
分类号 G03F7/40 主分类号 G03F7/40
代理机构 代理人
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