发明名称 Peripheral length correction device, peripheral length measurement device and surface defect inspection device
摘要 A peripheral length correction device with a metal ring wrapped around a pair rollers of a rotating driver side and a follower side, wherein, while regulating the separation distance of the pair of rollers and exerting a predetermined tension to the metal ring, corrects the metal ring peripheral length by strengthening the predetermined tension; a peripheral length measurement device which measures the separation distance to provide a measurement value and calculates the metal ring peripheral length from the measurement value; and a surface defect inspection device, wherein, while regulating the separation distance of the pair of rollers and exerting the predetermined tension to the metal ring, inspects for an existing surface defect on the metal ring, which comprise a scraper, wherein each of the pair of rollers has its outer circumferential surface in contact with a blade edge of the scraper.
申请公布号 US2006065029(A1) 申请公布日期 2006.03.30
申请号 US20050234154 申请日期 2005.09.26
申请人 JATCO LTD. 发明人 KURODA HIROAKI;MURAMATSU EIICHIRO
分类号 B21C51/00 主分类号 B21C51/00
代理机构 代理人
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