发明名称 Sequential data examination method
摘要 The present invention aims at providing a sequential data examination method which can increase data examination accuracy compared with the prior art. The similarity is calculated between a layered network model generated from learning sequential data to be learned and a layered network model generated from testing sequential data to be tested. Based on the similarity, it is determined whether or not the testing sequential data to be tested belong to one or more categories. A network model for each layer of the layered network model is constructed by multiplying an element of the feature vector and its corresponding Eigen co-occurrence matrix.
申请公布号 US2006069955(A1) 申请公布日期 2006.03.30
申请号 US20050179838 申请日期 2005.07.12
申请人 JAPAN SCIENCE AND TECHNOLOGY AGENCY 发明人 OKA MIZUKI;KATO KAZUHIKO
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
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