发明名称 |
Circuit path examining method for integrated circuit application, involves examining timing performance of circuit path as correct/incorrect, respectively, if pair of setup and hold time does not make/makes timing violation |
摘要 |
<p>The method involves identifying a timing performance of a circuit path to be examined, as correct, if a pair of a set up and holding time from several pairs, does not make a timing violation. The timing performance is identified as incorrect, if the pair of setup and holding time from the several pairs makes a timing violation. A pair with shortest possible set up time is determined as set up time and holding time for the path. An independent claim is also included for a device for examining a circuit path.</p> |
申请公布号 |
DE102004044668(A1) |
申请公布日期 |
2006.03.30 |
申请号 |
DE20041044668 |
申请日期 |
2004.09.15 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
LANG, ALFRED;BERGLER, STEFAN |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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