发明名称 Circuit path examining method for integrated circuit application, involves examining timing performance of circuit path as correct/incorrect, respectively, if pair of setup and hold time does not make/makes timing violation
摘要 <p>The method involves identifying a timing performance of a circuit path to be examined, as correct, if a pair of a set up and holding time from several pairs, does not make a timing violation. The timing performance is identified as incorrect, if the pair of setup and holding time from the several pairs makes a timing violation. A pair with shortest possible set up time is determined as set up time and holding time for the path. An independent claim is also included for a device for examining a circuit path.</p>
申请公布号 DE102004044668(A1) 申请公布日期 2006.03.30
申请号 DE20041044668 申请日期 2004.09.15
申请人 INFINEON TECHNOLOGIES AG 发明人 LANG, ALFRED;BERGLER, STEFAN
分类号 G06F17/50 主分类号 G06F17/50
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