发明名称 |
TESTING DEVICE |
摘要 |
A test device includes: the first reference clock generation unit for generating the first reference clock; the first test rate generation unit for generating the first test rate clock based on the first reference clock; the first driver unit for supplying the first test pattern to an electronic device based on the first test rate clock; the second reference clock generation unit for generating the second reference clock; the first phase synchronization unit for synchronizing the phase of the second reference clock with the phase of the first test rate clock; the second test rate generation unit for generating the second test rate clock based on the second reference clock having the synchronized phase; and the second driver unit for supplying the second test pattern to the electronic device based on the second test rate clock.
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申请公布号 |
EP1640736(A1) |
申请公布日期 |
2006.03.29 |
申请号 |
EP20040745604 |
申请日期 |
2004.06.04 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
CHIBA, NORIAKI;TSURUKI, YASUTAKA |
分类号 |
G01R31/28;G01R31/3183;G01R31/319;(IPC1-7):G01R31/318 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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