发明名称 PIEZOELECTRIC MATERIAL WORKING METHOD
摘要 <p>A mask (14) having a predetermined film thickness distribution is arranged on a piezoelectric material substrate (11), which is subjected to dry etching by using a working speed difference between the piezoelectric material substrate (11) and the mask (14), thereby obtaining a target 3-dimensional shape. The thickness distribution of the mask (14) is adjusted by pressurized fixation using a reflow, a precision mold (15). It is also possible to work the piezoelectric material substrate (11) into a 3-dimensional shape having an amplified film thickness distribution by adjusting the gas composition used for the dry etching. Thus, it is possible to work piezoelectric material into a predetermined 3-dimensional shape without introducing defects and obtain a highly accurate piezoelectric element of high quality.</p>
申请公布号 KR20060028386(A) 申请公布日期 2006.03.29
申请号 KR20057021399 申请日期 2005.11.10
申请人 JAPAN SCIENCE AND TECHNOLOGY AGENCY 发明人 ABE TAKASHI;LI LI;ESASHI MASAYOSHI
分类号 C04B41/91;H01L21/3065;C04B35/491;H03H3/02;H03H9/17 主分类号 C04B41/91
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