发明名称 |
PIEZOELECTRIC MATERIAL WORKING METHOD |
摘要 |
<p>A mask (14) having a predetermined film thickness distribution is arranged on a piezoelectric material substrate (11), which is subjected to dry etching by using a working speed difference between the piezoelectric material substrate (11) and the mask (14), thereby obtaining a target 3-dimensional shape. The thickness distribution of the mask (14) is adjusted by pressurized fixation using a reflow, a precision mold (15). It is also possible to work the piezoelectric material substrate (11) into a 3-dimensional shape having an amplified film thickness distribution by adjusting the gas composition used for the dry etching. Thus, it is possible to work piezoelectric material into a predetermined 3-dimensional shape without introducing defects and obtain a highly accurate piezoelectric element of high quality.</p> |
申请公布号 |
KR20060028386(A) |
申请公布日期 |
2006.03.29 |
申请号 |
KR20057021399 |
申请日期 |
2005.11.10 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY AGENCY |
发明人 |
ABE TAKASHI;LI LI;ESASHI MASAYOSHI |
分类号 |
C04B41/91;H01L21/3065;C04B35/491;H03H3/02;H03H9/17 |
主分类号 |
C04B41/91 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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