发明名称 Semiconductor device and method for manufacturing the same
摘要 The invention provides a semiconductor device and a method for manufacturing the same that are capable of improving the product performance and operational efficiency of a cross-point FeRAM, as well as increasing the area of capacitors included in the cross-point FeRAM. An upper electrode supporting layer forming mask for forming an upper electrode supporting layer can be made of a hard mask material. By making use of the upper electrode supporting layer forming mask remaining unremoved in forming and processing a lower electrode layer, prior to forming an upper electrode layer, a region where a ferroelectric capacitor is formed can be made larger than an area occupied by an intersection of the upper electrode layer and the lower electrode layer.
申请公布号 US7018854(B2) 申请公布日期 2006.03.28
申请号 US20040849016 申请日期 2004.05.20
申请人 SEIKO EPSON CORPORATION 发明人 FUKADA SHINICHI
分类号 H01L21/00;H01L27/105;G11C11/22;H01L21/02;H01L21/20;H01L21/8242;H01L21/8246;H01L27/115;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L21/00
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