发明名称 Method for testing a memory using an external test chip, and apparatus for carrying out the method
摘要 The invention provides an electronic memory apparatus having a memory module which is arranged on a first circuit chip and which has at least one memory bank for electronically storing data, and having a test module which has analysis units for testing the memory module. In this arrangement, the memory module is arranged on a first circuit chip. The test module is arranged on a second circuit chip which is provided so as to be physically separate from the memory module arranged on the first circuit chip, with the test module being connected to the memory module via a communication device.
申请公布号 US2006064261(A1) 申请公布日期 2006.03.23
申请号 US20050217060 申请日期 2005.08.31
申请人 INFINEON TECHNOLOGIES AG 发明人 BOLDT SVEN
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
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