发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a horizontal-type bipolar junction transistor, having a performance similar to the performance of a high-speed vertical type bipolar junction transistor. SOLUTION: There is included a PSWS (polysilicon sidewall spacer) which forms a contact region 112, contacting with a base region 110 of a vertical type bipolar junction transistor 100. Accordingly, a processing step of aligning a contact mask in the relatively narrow base region 110 is eliminated. Self matching of a base/emitter region is made by this sidewall spacer, and the base resistance and the junction capacitance are reduced. Accordingly, the cut-off frequency f<SB>τ</SB>is improved, and the oscillation frequency f<SB>max</SB>can be made maximum. Furthermore, a BiCMOS (bipolar CMOS) technique can be executed on an insulating substrate, such as SOI, using this new topology. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006080508(A) 申请公布日期 2006.03.23
申请号 JP20050244525 申请日期 2005.08.25
申请人 ASAHI KASEI MICROSYSTEMS KK 发明人 KANEKIYO KOJI;I-SHAN MICHAEL SUN;NG WAI TUNG
分类号 H01L21/331;H01L29/73 主分类号 H01L21/331
代理机构 代理人
主权项
地址