| 摘要 |
Provided is a semiconductor device that is insensitive to a change in a power supply voltage, inconsistencies in a manufacturing process, and a change in temperature and provides for a rapid read data operation. The semiconductor device includes a first read signal generator, a second read signal generator, and a voltage input/output sense amplifier. The first read signal generator generates a first read signal for sampling data in response to an enable signal of a column selection line. The second read signal generator generates a second read signal including a plurality of pulses during an enabling period of the first read signal in response to the first read signal. The voltage input/output sense amplifier receives a data value output from a memory cell, amplifies the data value in synchronization with the column selection line, and samples the data value in synchronization with enabling signals of the second read signal.
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