| 摘要 |
An x-ray beam ( 4 ) from a rotating anode source ( 8 ) is passed through an object ( 1 ) via a monochromator ( 9 ) and slit member ( 10 ) in order to determine the object's internal structure. The emerging radiation that is within the acceptance angle of a crystal analyser ( 5 ) is diffracted onto a PIN diode detector ( 6 ), which records an intensity profile of the radiation detected as a function of angular position of the crystal analyser ( 5 ). The resulting profile is analysed to provide a complex refractive index profile for the object ( 1 ) across the width of the beam ( 4 ). The analysis method and apparatus utilises both absorption and refraction information, and can provide both qualitative and quantitative information on the object's structure, with the dimensions of the slit member ( 10 ) providing an analytical intensity profile.
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