发明名称 FEATURE PATTERN RECOGNIZING SYSTEM, METHOD, AND PROGRAM
摘要 <p>A feature pattern recognizing system, its method, and a program for recognizing a feature pattern present in a sequence with high accuracy. The discrete symbols (such as base symbols) constituting a sequence (such as a DNA sequence) to be judged are digitized by using the frequency determined for each sequence position and for each type of the discrete symbols to create examination data or an examination data matrix X&lt;sub</p>
申请公布号 WO2006027913(A1) 申请公布日期 2006.03.16
申请号 WO2005JP14130 申请日期 2005.08.02
申请人 WASEDA UNIVERSITY;MATSUYAMA, YASUO;KAWAMURA, RYO;SHIMODA, KEITA 发明人 MATSUYAMA, YASUO;KAWAMURA, RYO;SHIMODA, KEITA
分类号 C12N15/09;C12Q1/68;G06F19/00;G06F19/22;G06N3/00 主分类号 C12N15/09
代理机构 代理人
主权项
地址