发明名称 PROBE UNIT
摘要 PROBLEM TO BE SOLVED: To provide a probe unit capable of detecting its lifetime dependent on wear of conductors. SOLUTION: The probe unit is provided with a substrate, a plurality of first conductors formed on the substrate and having first contact sections which are arrayed along one end of the substrate and come in touch with electrodes of a specimen, and a second conductor formed lower than the first contact sections on a part of the substrate between the one end of the substrate and the first contact sections. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006071405(A) 申请公布日期 2006.03.16
申请号 JP20040253964 申请日期 2004.09.01
申请人 YAMAHA CORP 发明人 TERADA YOSHIKI;SAWADA SHUICHI;ABE EIJI;HAGINO SUSUMU
分类号 G01R1/073 主分类号 G01R1/073
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