发明名称 Testing method and testing apparatus for liquid crystal panel
摘要 The present invention provides a technique enabling the amount of time required to evaluate the light fastness of a liquid crystal panel to be shortened. A method of testing the light fastness of a liquid crystal panel comprising a pair of substrates and a liquid crystal layer interposed between the substrates comprises the steps of: irradiating a test subject area of the liquid crystal panel with a laser beam, with at least one of the wavelength, the irradiation energy, and the irradiation duration of the laser beam set as a variable parameter; irradiating the liquid crystal panel with an observation beam and detecting the condition of the observation beam after passing through the liquid crystal panel; and evaluating the light fastness of the liquid crystal panel on the basis of a difference in the condition of the observation beam corresponding to the setting of the variable parameter of the laser beam.
申请公布号 US2006055931(A1) 申请公布日期 2006.03.16
申请号 US20050190029 申请日期 2005.07.26
申请人 UMETSU KAZUSHIGE;YAMADA SHUHEI 发明人 UMETSU KAZUSHIGE;YAMADA SHUHEI
分类号 G01N21/00 主分类号 G01N21/00
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