发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and semiconductor manufacturing equipment that can surely protect the surface of a chip and can evenly remove a crushed layer, formed after separation into chips. <P>SOLUTION: The semiconductor device manufacturing method comprises processes of forming an element region and an electrode on a semiconductor substrate, forming a protective film on the electrode, pasting a sheet on the protective film, dividing the semiconductor substrate into individual chips, and extending the sheet under controlled prescribed conditions. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066446(A) 申请公布日期 2006.03.09
申请号 JP20040243949 申请日期 2004.08.24
申请人 TOSHIBA CORP 发明人 FUJIWARA AKIHIRO
分类号 H01L21/301;H01L21/306;H01L33/30 主分类号 H01L21/301
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