发明名称 TEMPERATURE DETECTION CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To prevent a variation in the threshold voltage of a transistor from having an effect on a detected temperature. <P>SOLUTION: This temperature detection circuit comprises a temperature detection element D3 where a forward voltage varies as a temperature varies, a first FETM 3 connected in series with a temperature detection element D3 and lowering a voltage between gate-source electrodes, a second FETM 2 having a threshold voltage substantially identical to that of the first FETM 3 and current density per unit area higher than that of the first FETM 3 and performing temperature detection based on the fact whether the voltage between the gate-source electrodes is higher than the total voltage drop of the temperature detection element D3 and the first FETM 3 or not, and a circuit M1 for outputting a signal indicative of whether a threshold temperature is exceeded or not based on the operation of the second FETM 2. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066459(A) 申请公布日期 2006.03.09
申请号 JP20040244147 申请日期 2004.08.24
申请人 TOSHIBA CORP;TOSHIBA DISCRETE TECHNOLOGY KK 发明人 SANO YOSHIYUKI
分类号 H01L27/04;H01L21/822;H02H5/00 主分类号 H01L27/04
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