发明名称 CLEARANCE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a clearance measuring device capable of accurately measuring a clearance in thickness direction with a device with simple constitution when measuring the clearance of a thick measuring target. SOLUTION: The device is a clearance measuring device for obtaining the clearance between adjacent surfaces in a thick test target and has the following constitution: A base 400 wherein the test target is arranged and having notches near the clearance between adjacent surfaces. A photographing means (camera 100) arranged to have an inclined optical axis in the thickness direction of the test target on one side of the test target and acquiring the image of the test target. A light source 200 arranged on the other side of the test target and irradiating the test target through the notches in the base 400. An image processing means 800 for obtaining the clearance from the image of the test target obtained with the photographing means. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006064597(A) 申请公布日期 2006.03.09
申请号 JP20040249262 申请日期 2004.08.27
申请人 SUMITOMO ELECTRIC IND LTD 发明人 NISHIKAWA MASAYUKI;SHINOKI HIDEJI;SAKAGAMI SHUZO
分类号 G01B11/14 主分类号 G01B11/14
代理机构 代理人
主权项
地址