发明名称 |
METHOD, CIRCUIT HAVING FUNCTION AND PROGRAM OF RESISTANCE VALUE COMPENSATIONS, AND METHOD AND PROGRAM OF CIRCUIT RESISTANCE VALUE TESTS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a resistance compensating system of ODT circuit which is simple and high in accuracy. <P>SOLUTION: The resistance compensating system of compensating an ODT circuit 200 can realize a resistance value equivalent to a designated resistance value by combining a plurality of transistors, and is constituted in that a resistance value realized by selected transistors by selecting transistors to be combined in order is made to change in order. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006066833(A) |
申请公布日期 |
2006.03.09 |
申请号 |
JP20040250781 |
申请日期 |
2004.08.30 |
申请人 |
FUJITSU LTD |
发明人 |
MIYAKE HIROSHI;TOKUHIRO NORIYUKI;AIKAWA TADAO;MIYAZAKI YUJI |
分类号 |
H01L27/04;G06F3/00;G06F17/50;H01L21/822 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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