发明名称 METHOD, CIRCUIT HAVING FUNCTION AND PROGRAM OF RESISTANCE VALUE COMPENSATIONS, AND METHOD AND PROGRAM OF CIRCUIT RESISTANCE VALUE TESTS
摘要 <P>PROBLEM TO BE SOLVED: To provide a resistance compensating system of ODT circuit which is simple and high in accuracy. <P>SOLUTION: The resistance compensating system of compensating an ODT circuit 200 can realize a resistance value equivalent to a designated resistance value by combining a plurality of transistors, and is constituted in that a resistance value realized by selected transistors by selecting transistors to be combined in order is made to change in order. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066833(A) 申请公布日期 2006.03.09
申请号 JP20040250781 申请日期 2004.08.30
申请人 FUJITSU LTD 发明人 MIYAKE HIROSHI;TOKUHIRO NORIYUKI;AIKAWA TADAO;MIYAZAKI YUJI
分类号 H01L27/04;G06F3/00;G06F17/50;H01L21/822 主分类号 H01L27/04
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