Method and apparatus for mobility enhancement in a semiconductor device

摘要

A method and apparatus is presented that provides mobility enhancement in the channel region of a transistor. In one embodiment, a channel region ( 18 ) is formed over a substrate that is bi-axially stressed. Source ( 30 ) and drain ( 32 ) regions are formed over the substrate. The source and drain regions provide an additional uni-axial stress to the bi-axially stressed channel region. The uni-axial stress and the bi-axial stress are both compressive for P-channel transistors and both tensile for N-channel transistors. The result is that carrier mobility is enhanced for both short channel and long channel transistors. Both transistor types can be included on the same integrated circuit.