发明名称 CMP method and device capable of avoiding slurry residues
摘要 A method for chemical mechanical polishing (CMP) includes a rinsing process performed to clean an orifice of a slurry supplier and other elements of a CMP device. The CMP device includes least one nozzle disposed in the periphery of a base. The function of the nozzle is to spray DI water to the orifice of the slurry supplier so as to prevent slurry residue and clogging.
申请公布号 US7004820(B1) 申请公布日期 2006.02.28
申请号 US20050908814 申请日期 2005.05.26
申请人 UNITED MICROELECTRONICS CORP. 发明人 TENG CHING-WEN;KAO MING-HSING;LIN CHIN-KUN;CHUA ER-YANG;LAU LEE-LEE
分类号 B24B29/00 主分类号 B24B29/00
代理机构 代理人
主权项
地址