DIFFERENTIAL COMPARATOR CIRCUIT, TEST HEAD, AND TEST DEVICE

摘要

There is provided a differential comparator circuit which is mounted on a test device for testing a device under test for outputting a differential signal including a non-inverse signal and an inverse signal. The differential comparator circuit includes a differential signal subtraction circuit for calculating a differential signal indicating the difference between the non-inverse signal and the inverse signal and outputting it, a first threshold value subtraction circuit for calculating and outputting a first threshold value voltage indicating the difference between a first comparison voltage generated according to the ground potential of the device under test and a reference voltage generated according to the ground potential of the device under test, and a first comparison circuit for comparing the difference signal to the first threshold value voltage and outputting the comparison result.