TEST DEVICE AND TEST METHOD

摘要

There is provided a test device for testing a plurality of devices under test. The test device includes: a common pattern generation unit for generating a test signal common to the plurality of devices under test; a logic comparison unit arranged on each of the devices under test for judging whether a comparison result of an outputted result signal with a reference voltage coincides with an expected value; an addition pattern storage unit storing in advance an addition pattern to be added to the common pattern when the comparison result coincides with the expected value and when they do not coincide; and a separate pattern addition unit arranged on each of the devices under test for reading out the separate addition pattern to the device under test, adding it to the common pattern, and giving it to the device under test according to the result whether the comparison result coincides with the expected value.