发明名称 Inter-metal dielectric fill
摘要 An inter-metal dielectric (IMD) fill process includes depositing an insulating nanolaminate barrier layer. The nanolaminate is preferably an oxide liner formed by using an alternating layer deposition process. The layer is highly conformal and is an excellent diffusion barrier. Gaps between metal lines are filled using high density plasma chemical vapor deposition with a reactive species gas. The barrier layer protects the metal lines from shorts between neighboring layers. The resulting structure has substantially uneroded metal lines and an insulating IMD fill.
申请公布号 US2006038293(A1) 申请公布日期 2006.02.23
申请号 US20040924707 申请日期 2004.08.23
申请人 RUEGER NEAL R;HILL CHRIS W;BIAN ZAILONG;SMYTHE JOHN A III 发明人 RUEGER NEAL R.;HILL CHRIS W.;BIAN ZAILONG;SMYTHE JOHN A.III
分类号 H01L23/52;H01L23/48 主分类号 H01L23/52
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