| 摘要 |
PROBLEM TO BE SOLVED: To provide a means for measuring the analog characteristics of a signal by applying binary sampling. SOLUTION: A circuit 200 counting 0 or 1 in the binary sampling of a signal can measure the analog characteristics of a signal. The technology can perform parameters difficult to achieve by BER-based binary sampling technique with a relative simple circuit. The low-cost binary sampling circuit 200 can perform measurement conventionally needed more complex and expensive analog sampling. The new technology is applicable for a full-function test system, a low-cost test circuit, and an on-chip test circuit. COPYRIGHT: (C)2006,JPO&NCIPI
|
