发明名称 Methods and apparatuses for drying wafer
摘要 Apparatuses and methods of processing a substrate. The apparatus includes a wet-cleaning chamber, a drying chamber, and a substrate transferring chamber which transfers a substrate to and from the wet-cleaning chamber and the drying chamber. The drying chamber is one of a supercritical drying chamber or a low pressure drying chamber. The wet-cleaning chamber is one of a single-wafer cleaning chamber, a horizontal spinning chamber, a megasonic wet-cleaning chamber, or a horizontal spinning chamber having acoustic waves transmitted to the substrate.
申请公布号 US7000621(B1) 申请公布日期 2006.02.21
申请号 US20040009267 申请日期 2004.12.10
申请人 APPLIED MATERIALS, INC. 发明人 VERHAVERBEKE STEVEN
分类号 B08B3/00;B08B3/12;H01L21/00 主分类号 B08B3/00
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