发明名称 On-die switchable test circuit
摘要 An information handling system includes a computer system having at least one integrated circuit formed on a die. The integrated circuit includes an output circuit and a device pin operably connected with the output circuit. A load resistor (or other type of load or termination component) and a test switch for selectively connecting the load resistor to the output circuit are also formed on the die. In one aspect, the load resistor is selected to correspond with a representative system load.
申请公布号 US7002859(B2) 申请公布日期 2006.02.21
申请号 US20020187726 申请日期 2002.07.02
申请人 DELL PRODUCTS L.P. 发明人 FINN LARRY W.;MOHRMANN LEONARD E.
分类号 G11C7/00;G11C29/02 主分类号 G11C7/00
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