A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.
申请公布号
WO2006017581(A1)
申请公布日期
2006.02.16
申请号
WO2005US27574
申请日期
2005.08.02
申请人
K & S INTERCONNECT, INC.;TUNABOYLU, BAHADIR;MALANTONIO, EDWARD, L.;BEATSON, DAVID, T.;HMIEL, ANDREW
发明人
TUNABOYLU, BAHADIR;MALANTONIO, EDWARD, L.;BEATSON, DAVID, T.;HMIEL, ANDREW
