发明名称 |
METHOD FOR GENERATING LIGHT ELEMENT CHARACTERISTIC X RAY FROM INSULATOR BY LOW ENERGY ION IRRADIATION |
摘要 |
PROBLEM TO BE SOLVED: To provide a new method for generating light element characteristic X rays capable of efficiently generating the characteristic X rays of light elements with compact and low cost equipment. SOLUTION: Positive ions having low energy of 2 to 100 keV is cast on an insulator material target containing light element so that the characteristic X rays of light elment contained in insulator material target is generated in the light element characteristic X-ray generation method. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006046963(A) |
申请公布日期 |
2006.02.16 |
申请号 |
JP20040224587 |
申请日期 |
2004.07.30 |
申请人 |
NATIONAL INSTITUTE FOR MATERIALS SCIENCE |
发明人 |
HASEGAWA AKIRA;MITSUISHI KAZUKI;FURUYA KAZUO |
分类号 |
G21K5/08;G21K1/00;G21K1/087;G21K1/093;G21K5/04;H05G2/00 |
主分类号 |
G21K5/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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