发明名称 METHOD FOR GENERATING LIGHT ELEMENT CHARACTERISTIC X RAY FROM INSULATOR BY LOW ENERGY ION IRRADIATION
摘要 PROBLEM TO BE SOLVED: To provide a new method for generating light element characteristic X rays capable of efficiently generating the characteristic X rays of light elements with compact and low cost equipment. SOLUTION: Positive ions having low energy of 2 to 100 keV is cast on an insulator material target containing light element so that the characteristic X rays of light elment contained in insulator material target is generated in the light element characteristic X-ray generation method. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006046963(A) 申请公布日期 2006.02.16
申请号 JP20040224587 申请日期 2004.07.30
申请人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE 发明人 HASEGAWA AKIRA;MITSUISHI KAZUKI;FURUYA KAZUO
分类号 G21K5/08;G21K1/00;G21K1/087;G21K1/093;G21K5/04;H05G2/00 主分类号 G21K5/08
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