发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To reduce an area of an integrated circuit having a MIM capacity element, miniaturize a chip size and lower a chip cost. SOLUTION: A silicon substrate is provided with a first MIM capacity composed of a first metal film 301, a first insulating film 401, and a first electrode 501; and a second MIM capacity composed of a second metal film 302, a second insulating film 402, and a second electrode 502. The first electrode 501 is connected to the second metal film 302 by a tungsten plug 601, and the second electrode 502 is connected to the third metal film 303 by a tungsten plug 602. A wiring for connecting elements shares the respective metal films 301, 302; and positions of the first MIM capacity and the second MIM capacity are arranged at the same location. These MIM capacities are connected in parallel, thereby forming a semiconductor device having a structure in which a capacity density is increased without increasing a chip area. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006049486(A) 申请公布日期 2006.02.16
申请号 JP20040226734 申请日期 2004.08.03
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TSUJINO HIDEJI
分类号 H01L27/04;H01L21/768;H01L21/822;H01L23/522 主分类号 H01L27/04
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