Method and circuit arrangement for measuring current in an electric device

摘要

The method involves measuring the voltage on the source-drain path of the field effect transistor (2) and the temperature in the surroundings of the FET, measuring the current value of the supply voltage clocked by the pulse width modulation and deriving the current from the pulse width modulation, source-daring voltage, temperature and supply voltage. Independent claims are also included for the following: (A) a circuit arrangement for detecting current in electrical device (B) and a device with a d.c. motor and a drive circuit with an inventive circuit arrangement.