发明名称 Method for burn-in testing semiconductor dice
摘要 A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.
申请公布号 US6998860(B1) 申请公布日期 2006.02.14
申请号 US20000612696 申请日期 2000.07.10
申请人 MICRON TECHNOLOGY, INC. 发明人 WOOD ALAN G.;CORBETT TIM J.;CHADWICK GARY L.;HUANG CHENDER;KINSMAN LARRY D.
分类号 G01R31/02;G01R31/28 主分类号 G01R31/02
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