发明名称 EXPOSURE APPARATUS AND METHOD FOR MANUFACTURING MICRODEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an exposure apparatus which can favorably control the exposure width in a direction intersecting a scanning direction. <P>SOLUTION: The exposure apparatus carries out scanning exposure by synchronously moving a mask stage mounting a mask M2 and a substrate stage mounting a plate P2 in the scanning direction and is equipped with: partial projection optics PM1, PM3, PM5 in a first column disposed in a plurality of numbers as a first column at specified intervals in a direction intersecting the scanning direction so as to project a part of a mask pattern onto a plate; a partial projection optics PM4 or the like in a second column disposed in a plurality of numbers as a second column at a specified interval in the direction intersecting the scanning direction so as to project a part of the mask pattern onto a plate; shielding members 62a, 62b disposed at the ends in a direction intersecting the scanning direction so as to control the exposure width in a direction intersecting the scanning direction so as to block a part of the exposure light through the partial projection optics of the first column and a part of the exposure light through the partial projection optics of the second column; and driving units 64a, 64b to drive the light shielding members in a direction intersecting the scanning direction. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006039512(A) 申请公布日期 2006.02.09
申请号 JP20050149094 申请日期 2005.05.23
申请人 NIKON CORP 发明人 SASAMOTO MASAKI;IDA SANETAKA
分类号 G03F7/20;G02F1/1368;H01L21/027 主分类号 G03F7/20
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