发明名称 |
Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, manufacturing method of electronic device, and electronic device |
摘要 |
A pattern forming method including: (i) a process of forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing a Resin (P) including a non-acid-decomposable Repeating Unit (b1) represented by a following General Formula (b1) and a repeating unit including a group capable of being decomposed by acid and generating a polar group, and a Compound (B) capable of generating an acid through irradiation of actinic rays or irradiation; (ii) a process of exposing the film using actinic rays or radiation with a wavelength of equal to or less than 200 nm; and (iii) a process of developing the exposed film using a developer including an organic solvent containing a hetero atom and carbon atoms having 7 or more carbon atoms to forming a negative tone pattern.; |
申请公布号 |
US9383645(B2) |
申请公布日期 |
2016.07.05 |
申请号 |
US201414272034 |
申请日期 |
2014.05.07 |
申请人 |
FUJIFILM Corporation |
发明人 |
Yamaguchi Shuhei;Takahashi Hidenori;Yamamoto Kei;Yoshino Fumihiro |
分类号 |
G03F7/039;G03F7/32;G03F7/038;G03F7/004;G03F7/11;G03F7/20 |
主分类号 |
G03F7/039 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. A pattern forming method comprising:
(i) a process of forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing
a Resin (P) including a non-acid-decomposable Repeating Unit (b1) represented by the following General Formula (b1), a repeating unit including a group capable of being decomposed by acid and generating a polar group, and a repeating unit having a lactone structure in an amount of from greater than 0 mol % to 10 mol % or less with respect to all the repeating units within the Resin (P), anda Compound (B) capable of generating an acid through irradiation of actinic rays or irradiation; (ii) a process of exposing the film using actinic rays or radiation with a wavelength of equal to or less than 200 nm; and (iii) a process of developing the exposed film using a developer including an organic solvent containing a hetero atom and having 7 or more carbon atoms to form a negative tone pattern: in the formula, A represents an alicyclic hydrocarbon group including no oxygen atoms, and X0 represents a hydrogen atom or an alkyl group. |
地址 |
Tokyo JP |