发明名称 ETCHING SYSTEM AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an etching system capable of etching the circumferential edge portion of a semiconductor wafer surely. SOLUTION: The etching system comprises a holding/driving mechanism 1 for rotary driving a semiconductor wafer W in the peripheral direction while inclining such that the device surface d<SB>2</SB>becomes the underside in the inclining direction, and a control member 24 provided at a position corresponding to the lower end of the semiconductor wafer held by the holding/driving mechanism while opposing the outer circumferential part of the substrate and the peripheral part of a liquid receiving part 24a being supplied with etching liquid and the device surface of the substrate and having a portion 24b for introducing the etching liquid supplied to the liquid receiving part to the circumferential edge part of the device surface d<SB>2</SB>of the semiconductor wafer by surface tension. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006040957(A) 申请公布日期 2006.02.09
申请号 JP20040214714 申请日期 2004.07.22
申请人 SHIBAURA MECHATRONICS CORP 发明人 OSADA TAKESHI
分类号 H01L21/306;C23F1/08 主分类号 H01L21/306
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