发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 <p>A method of manufacturing a semiconductor device includes forming an insulation pattern over a substrate. The insulation pattern has at least one opening that exposes a surface of the substrate. Then, a first polysilicon layer is formed over the substrates such that the first polysilicon layer fills the opening. The first polysilicon layer also includes a void therein. An upper portion of the first polysilicon layer is removed such that void expands to a recess and the recess is exposed. A second polysilicon layer is formed over the substrate such that the second polysilicon layer fills the recess.</p>
申请公布号 KR100552588(B1) 申请公布日期 2006.02.09
申请号 KR20040085629 申请日期 2004.10.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YEO, IN JOON;LEE, WON JUN;KIM, TAE HYUN;KIM, JI HONG;YOON, BYOUNG MOON
分类号 H01L21/8247;H01L21/28;H01L27/115 主分类号 H01L21/8247
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