发明名称 Integrated circuit memory devices having zig-zag arrangements of column select IO blocks to increase input/output line routing efficiency
摘要 Integrated circuit memory devices include sense amplifier arrays having layouts that are configured to support greater pitch between adjacent input/output lines, while maintaining high levels of integration density. A sense amplifier array is provided having first and second column select I/O blocks that are arranged in an alternating zig-zag layout sequence, with the first column select I/O blocks positioned in a first row of the sense amplifier array and the second column select I/O blocks positioned in a second row of the sense amplifier array. The sense amplifier array also includes an alternating zig-zag layout sequence of first and second N-type (or P-type) sense amplifier blocks that extends back-and-forth between the first and second rows. The zig-zag layout sequence of sense amplifier blocks is interleaved with the zig-zag layout sequence of the column select I/O blocks.
申请公布号 US6996025(B2) 申请公布日期 2006.02.07
申请号 US20040774902 申请日期 2004.02.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE HYUN-SEOK;KIM KYUNG-HO;KIM HYEUN-SU
分类号 G11C8/00;G11C7/06;G11C7/18;G11C11/4091;G11C11/4097 主分类号 G11C8/00
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