发明名称 SUBSTRATE TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate treatment apparatus for enabling excellent substrate treatment by substantially uniformizing a temperature distribution of a treatment solution in a treatment tank . SOLUTION: The temperature of an etching solution is heated to etching temperature and kept unchanged by a heater 53 of a chemical preparing tank 50 and a heater 29 of a treatment tank 20. Further, a nitrogen gas kept at a gas discharge temperature higher than the etching temperature is supplied from a nitrogen gas supply nozzle 12 to the vicinity of an upper part of the treatment tank 20. As a result, it is possible to compensate heat transfer from the etching solution 21 and so keep a temperature distribution at each portion in the etching solution 21 substantially uniformly. Consequently, it is possible to execute excellent etching treatment. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006032673(A) 申请公布日期 2006.02.02
申请号 JP20040209682 申请日期 2004.07.16
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 MATSUBARA HIDEAKI
分类号 H01L21/306;B08B3/10;C23F1/08;H01L21/304 主分类号 H01L21/306
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