发明名称 FOREIGN MATTER ELIMINATING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an apparatus which is capable of a sequential process of eliminating foreign matters sticking to the back surface of a wafer, which is composed of a semiconductor, a glass, a board, and a resin, or of the board, and has a function of offering an optimum effect in eliminating the foreign matters, in response to the amount or size of the foreign matters sticking to the wafer or board, thus minimizes the required processing time per wafer or substrate. SOLUTION: The board is arranged to be attracted to electrostatic chucks via a resin sheet, capable of capturing foreign matters so that the resin sheet captures the foreign matters sticking to the back surface of the board. The resin sheet is rolled so as to be supplied in sequence for each board, and a piece of resin sheet used up in capturing the foreign matters is rolled to be recovered. When the entire roll of resin sheet is used up, it is scrapped and a new one is provided. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006032876(A) 申请公布日期 2006.02.02
申请号 JP20040232825 申请日期 2004.07.12
申请人 CREATIVE TECHNOLOGY:KK 发明人 TATSUMI YOSHIAKI;MIYASHITA KINYA;HARANO RIICHIRO
分类号 H01L21/304;H01L21/683 主分类号 H01L21/304
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