发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic system and a manufacturing method of the lithographic system capable of preventing the contamination of a projection optical system. <P>SOLUTION: The lithographic apparatus has a support configured so as to support a patterning device capable of forming a patternized radiation beam by giving a pattern to the section of the radiation beam. A projection system is configured so as to project the patternized radiation beam to the target portion of a substrate. The projection system is included in a first vacuum environment and a patterning device support is included in a second vacuum environment, the separator divides the first vacuum environment from the second vacuum environment. The separator has an opening from the first vacuum environment to the patterning device and/or reversely, an opening through which the projected beam is allowed to pass. The patterning device forms at least a part of seal that almost seals the opening of the separator. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006032953(A) 申请公布日期 2006.02.02
申请号 JP20050201993 申请日期 2005.07.11
申请人 ASML NETHERLANDS BV 发明人 LUTTIKHUIS BERNARDUS ANTONIUS JOHANNES;BARTRAY PERTRUS R;JACOBS JOHANNES HENRICUS W;HARINK THIJS;LIEBREGTS PAULUS MARTINUS MARIA
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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