发明名称 CHARGE TRAPPING NONVOLATILE MEMORY AND ITS GATE BY GATE ERASING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To obtain a multigate memory cell having a semiconductor body, and a plurality of gates arranged continuously on the semiconductor body. <P>SOLUTION: Charge storage structure of a semiconductor body is provided with a charge trapping position below a gate among a plurality of gates. A circuit for conducting a source and drain bias voltage to a semiconductor body proximate to first and last continuous gates, and a circuit for conducting a gate bias voltage to the plurality of gates are provided. The multigate memory cell is provided with a continuous multigate channel region below the plurality of continuous gates along with a charge storage position between respective gates. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006024938(A) 申请公布日期 2006.01.26
申请号 JP20050197408 申请日期 2005.07.06
申请人 MACRONIX INTERNATL CO LTD 发明人 YEH CHIH-CHIEH
分类号 H01L21/8247;G11C16/02;G11C16/04;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址