发明名称 Method for fabricating a trench contact to a deep trench capacitor having a polysilicon filling
摘要 The instant invention is a method for fabricating a trench contact to a deep trench capacitor with a polysilicon filling in a trench hole formed in a silicon substrate. An epitaxy process is performed to selectively grow silicon above the polysilicon filling in the trench hole. An opening leading to the polysilicon filling is anisotropically etched into the epitaxially grown silicon. The opening has lateral dimensions that are smaller than those of the polysilicon filling, and the opening is filled with polysilicon.
申请公布号 US6989311(B2) 申请公布日期 2006.01.24
申请号 US20020147544 申请日期 2002.05.16
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHREMS MARTIN;TEMMLER DIETMAR;WICH-GLASEN ANDREAS
分类号 H01L21/20;H01L21/60;H01L21/8242 主分类号 H01L21/20
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