发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, INSPECTING APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTING METHOD
摘要 <p>An information fetching register (103) for fetching data being transmitted on a bus (111) is connected with the bus (111), and a wireless communication circuit (102) for wirelessly transmitting the data fetched by the information fetching register (103) is connected with the information fetching register (103). When the data being transmitted on the bus (111) is fetched by the information fetching register (103), the wireless communication circuit (102) transmits the data fetched by the information fetching register (103) to the external via an antenna (101).</p>
申请公布号 WO2006006700(A1) 申请公布日期 2006.01.19
申请号 WO2005JP13111 申请日期 2005.07.08
申请人 SEIKO EPSON CORPORATION 发明人 IIDA, IZUMI;INOGUCHI, MAKOTO
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址