| 摘要 |
PROBLEM TO BE SOLVED: To provide a defect inspection apparatus for a magnetic tape enabling higher accuracy judgment and assortment of stripes on the magnetic tape which are heretofore impossible with the conventional apparatus. SOLUTION: The defect inspection apparatus is provided with a path roll, an irradiation device irradiating the magnetic tape traveling on the path roll with parallel light, a ceramic screen projecting the light reflected from the magnetic tape, and a photodetector capturing the image formed on the ceramic screen as a bright and dark signal. COPYRIGHT: (C)2006,JPO&NCIPI
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